ZSX Primus IV

Tube-above sequential wavelength dispersive X-ray fluorescence spectrometer

Tube-above sequential WDXRF spectrometer that quickly measures major and minor elements, from beryllium (Be) to uranium (U), in many sample types with minimal use of standards.

ZSX Primus IV𝒾

sequential wavelength dispersive X-ray fluorescence spectrometer

The tube-below high-performance model enables uncompromised analysis of liquids, alloys, and plated metals. Providing superior performance with the flexibility for analyzing the most complex samples, it features a 30-micron Be tube window, the thinnest standard tube window in the industry, for exceptional light element (low-Z) detection limits.

Ultra Carry

sample retainer for xrf analysis

Disposable (single-use) sample retainer for X-ray fluorescence (XRF) analysis used to pre-concentrate an aqueous liquid sample onto a uniform sample carrier optimized for the suppression of background noise.

NEX XT

Sulfur process analyzer

Process Sulfur Gauge for Petroleum Streams

NEX OL

elemental analyzer for liquid process streams

Process EDXRF Elemental Analyzer for Liquid Process Streams

NEX LS

Multi-element Coating Analyzer

The Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.