ZSX Primus IV

Buisvormige sequentiële golflengtedispersieve röntgenfluorescentiespectrometer

Wavelength dispersive X-ray fluorescence spectrometer for elemental analysis of solids, liquids, powders, alloys and thin films.

Nieuwe ZSX Guidance XRF-software met expertsysteem

ZSX Guidance helps you with every part of XRF measurement and data analysis. In the past, only experts could perform accurate analysis. Now, with ZSX Guidance software, the built-in expertise handles the complex settings for you.

Operators only need to enter basic information about the samples, elements to analyze, and standard compositions. The software then automatically selects the best measurement lines, background settings, and correction parameters, including line overlaps, using qualitative spectra to guide the process. You can perform elemental analysis of solids, liquids, powders, alloys and thin films.

Uitzonderlijke lichtelement XRF-prestaties met omgekeerde optiek voor superieure betrouwbaarheid

ZSX Primus IV features an innovative optics-above configuration. The ZSX Primus IV features a unique optics-above design. This innovative setup keeps the beam path clean, reducing the risk of contamination and minimizing downtime for sample chamber maintenance.

The ZSX Primus IV WDXRF spectrometer delivers outstanding performance and flexibility, even for the most complex samples. It’s equipped with a 30-micron end-window tube, the thinnest in the industry, for exceptional detection of light elements (low-Z).

Mapping and multi-spot XRF analysis with wavelength dispersive X-ray fluorescence spectrometer

The ZSX Primus IV, combined with an advanced mapping package, makes it easy to perform detailed XRF spectrometric investigations of samples. It quickly detects sample homogeneity and inclusions. This capability delivers analytical insights that are hard to achieve with other analytical methodologies. In addition, the available multi-spot analysis also helps reduce sampling errors when working with inhomogeneous materials.

SQX fundamentele parameters met EZ-scan software

EZ-scan makes it easy to perform XRF elemental analysis of unknown samples without any prior setup. This time-saving feature requires only a few clicks of the mouse and a sample name to get started. Furthermore, when combined with SQX fundamental parameters software, it delivers the most accurate and rapid XRF results possible.

Notably, SQX corrects for all matrix effects, including line overlaps. It also accounts for secondary excitation by photoelectrons (light and ultra-light elements), varying atmospheres, impurities, and different sample sizes. For even greater accuracy, it can be combined with matching library and perfect scan analysis programs.