Rigaku

ZSX Primus IVš’¾

The tube-below high-performance model enables uncompromised analysis of liquids, alloys, and plated metals. Providing superior performance with the flexibility for analyzing the most complex samples, it features a 30-micron Be tube window, the thinnest standard tube window in the industry, for exceptional light element (low-Z) detection limits.
Uncompromised X-ray analysis of liquids, alloys, and plated metals

ZSX Primus IVš’¾

Tube-below sequential wavelength dispersive X-ray fluorescence spectrometer

Sequential wavelength dispersive X-ray fluorescence spectrometer for uncompromised X-ray analysis of liquids, alloys, and plated metals.

 

Vacuum (partition) system for analyzing liquids

Since the spectrometer chamber is always under vacuum, switching from a vacuum to a helium atmosphere takes less than two minutes. Additionally, helium gas consumption is significantly reduced compared to models that require purging of the chamber.

Improved throughput

Improved mechanics reduce the analysis dead time. For instance, the time for a 16-element sequential quantitative measurement has been reduced from 348 seconds to 287 seconds, increasing efficiency by 18%.

D-MCA high-speed analysis

The Digital Multi-Channel Analyzer (D-MCA) system enables high-speed digital processing, handling high count rates for better analytical precision and faster throughput.

Optical system not easily impacted by sample surface height variations

An uneven sample surface can cause variations in the distance between the sample and the X-ray tube. These differences can cause changes in the X-ray intensity. Rigaku optical systems help minimize X-ray intensity changes caused by distance variations.

This ensures accurate analysis by reducing the effects of shape variations from fusion molds used in glass bead formulation and the impact of uneven sample surfaces during powder sample pressing.

Point/mapping analysis with sequential wavelength dispersive X-ray fluorescence spectrometerĀ 

Equipped with a high-resolution camera, that system lets users zoom in on small features for precise identification and analysis. It ensures accurate results by eliminating differences in sensitivity caused by measurement placement. The superior design uses the tube’s hot-spot to maximize intensity and sensitivity.

Refined SQX analysis with sequential wavelength dispersive X-ray fluorescence spectrometerĀ 

SQX is standardless FP analysis software that calculates accurate elemental composition, now easier to use than ever.

Automated center wire cleaning mechanism

The center wire of the F-PC detector gradually becomes contaminated by the proportional counter quench gas, reducing resolution. The center wire cleaning mechanism restores performance by removing center wire contamination through electrical heating, without the need to shut off the power source or to open the cabinet.

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Compared to competing XRF systems, the Rigaku Supermini200 offers superior fundamental parameters and empirical software capabilities in a high resolution instrument with a compact footprint. As a high-power benchtop sequential wavelength dispersive
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Elemental analysis of solids, liquids, powders, alloys and thin films

ZSX Primus IV

Tube-above sequential WDXRF spectrometer that quickly measures major and minor elements, from beryllium (Be) to uranium (U), in many sample types with minimal use of standards.
Elemental analysis of solids, liquids, powders, alloys and thin films

ZSX Primus III NEXT

Rigaku ZSX Primus III NEXT delivers rapid elemental industrial quality control by quantitative determination of major and minor elements from Be through Cm for powder and solid samples.
Elemental analysis of solid samples
X-ray tube-above configuration

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