Multi-component product analysis and quality control
The SpectraAlyzer FLEX is a customizable analyzer designed to meet individual requirements. It enables the analysis and monitoring of a wide range of product parameters, allowing quality checks regardless of sample type. It is ideal for multi-component product analysis and quality control.
If none of the existing SpectraAlyzer models meet your specific needs, consider the SpectraAlyzer FLEX. We’re here to help identify which product parameters can be measured with a tailored instrument configuration for your application.
In many production processes, it is essential to analyze samples at various stages along the production chain. These samples often exist in different physical states, including liquids, granules, powders, pastes, and viscous materials. To analyze these various sample types, the SpectraAlyzer FLEX offers the flexibility of using different drawers and a wide range of additional sample cups. Some examples:
- Pastes in a standard drawer with an open cup
- Powders in a standard drawer with a closed cup
- Viscous samples in a standard drawer with a viscous cup
- Granulate / grain in a rotating cup drawer with a rotating cup
- Liquids with the liquid drawer
Features
NIR sample/reference technology
Like all SpectraAlyzer® instruments for high sensitive and long term stable measurements
Versatile sample presentation
With closed, open, viscous, slide and disposable cups for powders, pastes, slurries and liquids
User friendly
Sample presentation and easy to operate
Compact design
Optimized for benchtop or at-line operation
Touch user interface
It features an intrinsically mounted glass touch panel, enabling straightforward and hygienic instrument operation
Many mathematical models
For all types of products, allowing for quick calibration model installation and fast start-up
Webserver
Web connectivity for direct instrument access via LAN and internet from anywhere, anytime
Technical data
Spectral range | 800-2500 nm |
Wavelength Accuracy | <0.02 nm |
Wavelength Precision | <0.005 nm |
Optical bandwidth | < 10 nm ±2 nm |
Dual beam system, sample / reference measurement | |
High signal to noise ratio | > 150.000:1 |
Large expandable internal memory for calibration models, methods and history results | |
Auto-diagnostics | |
Graphical user interface, projected capacitive glass touch panel |