NEX DE Series

NEX DE Series elemental analyzers deliver high-performance results when analysis time or sample throughput is critical. These instruments provide expanded analytical capabilities, including higher sample batch throughput, small-spot analysis, or enhanced performance for measurement of higher atomic number elements. They are designed for speed and precision, important for high-volume analytical labs or fast-paced settings. 

The Rigaku NEX DE Series are high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometers. These instruments provide rapid, non-destructive elemental analysis of sodium to uranium in al most any sample type.

They have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-throughput silicon drift detector (SDD) that supports count rates over 500K cps. The high-count rates deliver low limits of detection and provide excellent spectral resolution and high-throughput measurements are obtained with various interchangeable automatic sample changers. Combined with the powerful QuantEZ software, these features provide unparalleled performance.

Small-spot EDXRF measurements

For applications requiring small-spot analysis, the NEX DE VS model offers a high-resolution camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes.  The instrument’s large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall. The Point Analysis interface and integrated backlit camera allow easy sample positioning. NEX DE VS is an excellent option for measuring coatings on smaller parts, screening small samples for electronic waste initiatives. It’s also excellent for investigating the identification of foreign matter of unknown composition. 

Key advantages and features of the NEX DE Series:

• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Solids, liquids, alloys, powders and thin films
• High-performance SDD for superior data
• Unmatched performance-to-price ratio
• Powerful and easy-to-use QuantEZ software with multilingual user interface
• 60 kV X-ray tube for wide elemental coverage
• Multiple automated tube filters for enhanced sensitivity
• Advanced RPF-SQX Fundamental Parameters software featuring Rigaku Scattering FP
• SureDI support for 21 CFR Part 11 compliance
• High-res camera and automated collimators for accurate sample positioning (NEX DE VS)
• Analyze 1 mm, 3 mm, and 10 mm spot sizes (NEX DE VS)

Whether the need is basic quality control (QC) or its more sophisticated variants such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma — NEX DE Series spectrometers deliver quick, high-performance results without complex setups.

Models include NEX DE and NEX DE VS.