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In-line, multi-element coating analyzer by EDXRF
NEX LS is a compact, in-line energy dispersive X-ray fluorescence (EDXRF) system is ideal for scanning multi-element coating analysis. The in-line, multi-element coating analyzer supports routine quality control in web and coil applications. The system delivers crucial data on coating properties and product composition. Product quality relies on accurate coating thicknesses, correct coat weight, and proper elemental composition of a product.
NEX LS enables continuous monitoring of these without interrupting production. With advanced third-generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX LS is a next-generation scanning multi-element process coating analyzer, specifically designed for web or coil applications.
How does it work?
The NEX LS is an in-line scanning measurement system that comes with an EDXRF analytical head. It delivers real-time elemental analysis for elements aluminium (Al) to uranium (U). This makes it an essential tool for roll-to-roll (R2R) manufacturing processes.
The analytical head moves back and forth across a moving web or coil, sending measurements data to a console box and industrial touchscreen computer. Results appear in real time as graphical cross-direction and machine-direction profiles. You can choose between full scanning mode or set specific fixed analysis positions.
Fluorescence X à dispersion d'énergie (EDXRF)
To ensure superior analytical performance and reliability, the EDXRF measuring head in the NEX LS is built on Rigaku’s proven NEX Series high-resolution benchtop instruments. With proven technology, the Rigaku NEX LS delivers fast, non-destructive, multi-element analyses. It measures coat weight, coating thickness and composition for elements ranging from aluminium (₁₃Al) to uranium (₉₂U).
Épaisseur et composition du revêtement
Rigaku NEX LS is ideal for web and coil applications, offering multi-element analysis of composition, coat weight, or coating thickness. The measuring head is mounted on a rigid beam and uses a linear traversing mechanism over a roller, ensuring a consistent distance between the head and the surface.
It directly measures the elemental composition of a coating where needed. The system can also measure coat weight (or coating thickness) directly, as the counting rate for an element is proportional to its thickness. Alternatively, it can measure indirectly by assessing the attenuation of a substrate element, where the counting rate is negatively correlated to the thickness.
Revêtements antiadhésifs à base de silicone
Benchtop EDXRF spectrometers have long been a reliable technology for release coatings, converters, vacuum-formed plastics manufacturers, and other industries that use silicone oils as barrier layers, release coatings, or denesting agents. Real-time scanning enhances process control, allowing for tighter tolerances and advancing EDXRF technology for silicone coatings analysis. Silicone coatings are applied to plastic and paper substrates to adjust the release properties of a product like labels or packaging.
Applying too little silicone or having areas on the web where the silicone coating is missing can negatively impact the adhesive release properties. This is especially true in release applications. Additionally, compromised denesting characteristics of the vacuum-formed plastic can lead to product rejection or disruptions in manufacturing and other downstream processes. Applying too much silicone increases the cost of the manufactured roll, reducing profitability. In some cases, it can also affect the acceptance and performance of the end product.
